Application of very fast simulated reannealing (VFSR) to low power design
EMBEDDED COMPUTER SYSTEMS: ARCHITECTURES, MODELING, AND SIMULATION, cilt.3553, ss.308-313, 2005 (SCI-Expanded)
- Yayın Türü: Makale / Tam Makale
- Cilt numarası: 3553
- Basım Tarihi: 2005
- Dergi Adı: EMBEDDED COMPUTER SYSTEMS: ARCHITECTURES, MODELING, AND SIMULATION
- Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED)
- Sayfa Sayıları: ss.308-313
- Akdeniz Üniversitesi Adresli: Hayır
Özet
This paper addresses the problem of optimal supply and threshold voltage selection with device sizing by minimizing power consumption and maximizing battery charge capacitance using Very Fast Simulated Reannealing (VFSR). We assume that multiple supply voltages and multiple threshold voltage devices are available at gate level. Minimizing power consumption does not necessarily maximize battery charge capacitance. This paper achieves this by implementing both objectives in the cost function.