Preparation of thin Bi2Sr2CaCu2Ox (2212) film and electrical measurements

Varilci A., Yanmaz E., Mutlu İ. H.

Turkish Journal of Physics, vol.20, no.9, pp.1012-1016, 1996 (Scopus) identifier

  • Publication Type: Article / Article
  • Volume: 20 Issue: 9
  • Publication Date: 1996
  • Journal Name: Turkish Journal of Physics
  • Journal Indexes: Scopus, TR DİZİN (ULAKBİM)
  • Page Numbers: pp.1012-1016
  • Akdeniz University Affiliated: No


A thin film with the nominal composition of Bi2Sr2CaCu2Ox(2212) was prepared on a MgO single crystal substrate by electron beam evaporation technique. The film, analyzed by x-ray diffraction, showed a preferential orientation with the c-axis prependicular to the substrate. The existence of at least two phases was seen from x-ray analysis. Electrical measurement was performed on the thin film of 2212 composition. The resistivity was confirmed to be smaller then 0.20×10-4Ω.cm by using the van der Pauw method at 300K and critical current density was in excess of 1.2×104 A/cm2 at 38K in zero field. © Tübi̇tak.